Materials research and analysis platform

The Materials research and analysis platform (PRAM) is dedicated to training, research, teaching and service. It makes its characterization techniques available not only to researchers and students at the university and elsewhere, but also to companies and public-sector bodies. It gives its partners and customers access to ultra-specialized techniques and the support of a multidisciplinary team of specialists in the various fields of materials research, analysis and characterization. The platform offers a series of validated methods for the analysis of some one hundred trace organic contaminants in solid and liquid matrices of environmental interest. The platform is managed by a professional in charge of maintenance and technical and scientific support.

Types of contaminants analyzed:

• Metals and metalloids
• thin films and surface analysis

• Atomic Force Microscope (AFM) [Nanoscope IIIa de Digital Instruments];
• Variable-pressure scanning electron microscopy (VP-SEM) [S-3000N de Hitachi];
• Field-effect scanning electron microscopy (FEG-SEM) [S-4700 de Hitachi];
• Transmission electronic Microscope (TEM) [ H-7500 from Hitachi];
• Chemical analysis by electron spectroscopy (XPS) [XPS Axis UltraDLD de Kratos];
• Wavelength-dispersive X-ray fluorescence spectroscopy(WD-XRF) [Axios Advanced de Panalytical].

• Chemical analyses

Types of matrices 

• Soil, sludge, sediments